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AITHER's Enhanced Sensing Package (ESP) softwareGet the data you really want from your si425 with ESPNow available for the sm125, as wellThe current OEM software provided with the si425 for operating and monitoring the unit from a remote computer only displays fiber Bragg grating (FBG) sensor wavelength and allows for the display of just a single sensor trace. AITHER has developed a highly flexible sensing software package for Micron Optics Inc.’s si425 FBG interrogation system that enhances the data display and storage capabilities of this highly capable instrument.
ESP BenefitsReduced Computational OverheadESP uses an enhanced data handling structure within the LabView environment, which more efficiently processes and displays FBG sensor data reported from the si425 unit. For the user this means that the remote monitoring/control computer is able to process and display measurement readings without data bottlenecks that can reduce the speed of the si425. Sensor ConfigurationThe si425 FBG interrogator can simultaneously monitor a large number of sensors. Can you remember what sensor 14 on channel 3 is measuring? ESP can. The ESP software provides the user with a sensor configuration module that allows easy setup and configuration of large numbers of sensors. The user can define individual sensor names and sensor types for each sensor in the measurement system, making data cataloging and system monitoring straightforward. The sensor configuration can be saved for later use so that large-scale periodic tests do not require costly setup time over and over again. Sensor data can be stored as wavelength or as the particular engineering unit of interest (strain, temperature, acceleration, RH, etc.) using defined calibration coefficients. Helpful pop-up messages provide guidance and warnings to the user to ensure that data collection runs smoothly.
Multi-Sensor PlotsThe ESP software package allows the user to display/monitor up to 8 sensor time traces on a single screen with no reduction in the performance capabilities of the si425 instrument. Two time trace plots can be viewed simultaneously to group sensors of interest together. These plots can be displayed in the Bragg wavelengths of the sensors or the actual measurement units such as strain, temperature, or acceleration. ESP allows for greater functionality not just in the display of your data, but also in the storage of your data. The following table compares the features of ESP with the OEM software provided by Micron Optics Inc.
A free demonstration version is available that retains all of the functionality of the full software without the ability to save sensor profiles or measurement data. We value any feedback you may have on your use of the software. To obtain your free demonstration software please e-mail: techsupport@aitherengineering.com If you are interested in purchasing or learning more about this software, please contact us at info@aitherengineering.com. AITHER can also customize a software package to meet the needs of your specific application if the standard version is not suitable. Please Submit your sensing requirements today! |










